Publications

MSC Patents

1986SU1362353Method of mass spectrometric analysis of chemical compounds
1996US5917184, WO1997029508Interface between liquid flow and mass spectrometer
1999US6504150, WO2000077822Method and apparatus for determining molecular weight of labile molecules
1999US6534764, WO2000077823Tandem time-of-flight MS accompanied with attenuation in collisional chamber
1999US6483109, WO2001015201Multiple stage mass spectrometer
2000US6545268, WO2001078106Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
2002GB2390935, WO200400848Time-nested mass analysis using a TOF-TOF tandem mass spectrometer
2002US7196324Tandem time-of-flight mass spectrometer and method of use
2003US6903334High throughput ion source for MALDI mass spectrometry
2004RU2004113413Laser microanalyzer and mode of analyzing materials
2003GB2403063, US7385187Multi-reflecting time-of-flight mass spectrometer and a method of use
2003GB2403063, WO2005001878TOF MS employing a plurality of lenses focusing an ion beam in shift direction
2005US7772547, WO2007044696Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration
2005US7326925, WO2006102430Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface
2005US7582864Linear ion trap with an imbalanced radio frequency field
2008US8373120, WO2010014077Method and apparatus for ion manipulation using mesh in a radio frequency field
2008US9425034, WO2010008386Quasi-planar multi-reflecting time-of-flight mass spectrometer
2010US9048080, WO2012024468Time-of-Flight mass spectrometer with accumulating electron impact ion source
2010US9070541, WO2012024570Mass spectrometer with soft ionizing glow discharge and conditioner
2010GB2476964Electrostatic trap mass spectrometer
2010US9082604, WO2011086430Ion trap mass spectrometer
2010GB2478300, US93121119, WO2011107836Open trap mass spectrometer
2010US8853623, WO2011135477Electrostatic mass spectrometer with encoded frequent pulses
2010US9728384 WO2012092457Electrostatic trap mass spectrometer with improved ion injection
2011US9396922, WO2013063587Electrostatic ion mirrors
2011US8921772, WO2013067366Ion mobility spectrometer
2012US9123521, WO2013163530Electron impact source with fast response
2012US9472390, WO2013192161Tandem time-of-flight mass spectrometry with non-uniform sampling
2012US9683963, WO2014021960Ion mobility spectrometer with high throughput
2012WO2014074822Cylindrical multi-reflecting time-of-flight mass spectrometer
2013US9865445, WO2014142897Multi-reflecting mass spectrometer
2013US9779923, WO2014152902Methods and system for tandem mass spectrometry
2013US9881780, WO2014176316Multi-reflecting mass spectrometer with high throughput
2014US20170016863, WO2015152968Method of targeted mass spectrometric analysis
2014US20170032952, WO2015153630Multi-reflecting time-of-flight mass spectrometer with an axial pulsed converter
2014US20170025265, WO2015153622Right angle time-of-flight detectors with an extended life time
2014JP2015038879Pseudo plane multireflecting time-of-flight type mass spectrometer
2014US2017278688, WO2016037034Soft Ionization Based on Conditioned Glow Discharge for Quantitative Analysis
2014US2017338094, WO2016064398A multi-reflecting Time-of-flight analyzer
2015GB2554291, WO2016174462Multi-reflecting TOF mass spectrometer
2015WO2017087470Imaging mass spectrometer
2015WO2017087456Imaging mass spectrometer
2015GB201520540, WO2017091501Improved ion mirror and ion-optical lens for imaging
2016WO2018033494Mass analyzer having extended flight path
2015WO2017042665Resonance Mass Separator
2015WO2017089991Method of targeted trace analysis with RF ion mirror
2017GB 1712612.9Improved ion injection into multi-pass mass spectrometers
2017GB 1712613.7Improved accelerator for multi-pass mass spectrometers
2017GB 1712614.5Improved ion mirror for multi-reflecting mass spectrometers
2017GB 1712616.0Printed circuit ion mirror with compensation
2017GB 1712617.8Multi-pass mass spectrometer with improved sensitivity
2017GB 1712618.6Ion guide within pulsed converters
2017GB1712619.4Improved fields for multi-reflecting TOF MS

MSC Papers

A. N. Verentchikov, M. I. Yavor, Y. I. Hasin, M. A. Gavrik “Multi-reflecting TOF analyzer for high resolution MS and parallel MS-MS” MASS-SPECTROMETRY 2005, 2(1), 11-22.
A. N. Verentchikov, M. I. Yavor, Y. I. Hasin, M. A. Gavrik. ” Multireflection Planar Time-of-Flight Mass Analyzer. I: An Analyzer for a Parallel Tandem Spectrometer” TECHNICAL PHYSICS 2005, 50(1), 73–81.
A. N. Verentchikov, M. I. Yavor, Y. I. Hasin, M. A. Gavrik ” Multireflection Planar Time-of-Flight Mass Analyzer. II: The High-Resolution Mode ” TECHNICAL PHYSICS 2005, 50(1), 82–86.
M. I. Yavor, A. N. Verentchikov, Y. I. Hasin, B.N. Kozlov, M. A. Gavrik, A.S. Trufanov ” Planar Multi-Reflecting Time-Of-Flight Mass Analyzer With A Jig-Saw Ion Path” PHYSICS PROCEDIA 2008, 1, 391–400.
A. N. Verentchikov “A Concept Of Multireflecting Mass Spectrometer For Continuous Ion Sources” НАУЧНОЕ ПРИБОРОСТРОЕНИЕ 2006, 16(3), 3–20.
B. N. Kozlov, Y. I. Hasin, S. N. Kirillov, A. S. Trufanov, M. A. Gavrik, A. N. Verentchikov “Experimental Studies Of Space Charge Effects In Multireflecting Time-Of-Flight Mass Spectrometers” НАУЧНОЕ ПРИБОРОСТРОЕНИЕ 2006,16(3), 49–58.
A. N. Verentchikov ” ToF Mass Spectrometry Of Biopolymers Based On Planar Multi-Reflection Analyzers “. DOCTORAL THESIS 2006.
T. V. Pomozov, M. I. Yavor “Possibility Of Performance Improvement Of Planar Gridless Ion Mirrors” НАУЧНОЕ ПРИБОРОСТРОЕНИЕ 2011, 21(2), 90–97.
A.N. Verentchikov, S.N. Kirillov, B.N. Kozlov, D.N. Alexeev, M.I.Yavor “Multi-Reflecting TOF MS with Isochronous Curved Inlet and Pulsed Ion Trap” Abstr. ICMS Conference: Bremen 2009.
T. V. Pomozov, M. I. Yavor, A. N. Verentchikov ” Reflectrons With Ion Orthogonal Acceleration Based On Planar Gridless Mirrors” TECHNICAL PHYSICS 2012, 57, 550-555.
A. A. Lobas, A. N. Verenchikov, A. A. Goloborodko, L.I. Levitsky, M.V. Gorshkov “Combination Of Edman Degradation Of Peptides With Liquid Chromatography / Massspectrometry Workflow For Peptide Identification In Bottom-Up Proteomics” Rapid Commun. Mass Spectrom. 2013, 27, 391–400.
A. N. Verenchikov, A. P. Kolosov “A Soft Ionization Method for Semivolatile Compounds” JOURNAL OF ANALYTICAL CHEMISTRY 2015, 70(13), 1527–1532.
A.N. Verenchikov, S.N. Kirillov, Y.I. Khasin, V. Makarov, M.I. Yavor, V. Artaev “Multiplexing in Multi-Reflecting TOF MS ” JOURNAL OF APPLIED SOLUTION CHEMISTRY AND MODELING 2017, 6, 1-22.
T. Dickel, W.R. Pla, W. Lippert, J. Lang, M.Yavor, H. Geissel, C. Scheidenberge “Isobar Separation in a Multiple-ReflectionTime-of-Flight Mass Spectrometer by Mass-Selective Re-Trapping” J.AM.SOC.MASSSPECTROM 2017, 28:1079Y1090.
M. I.Yavor, A. N. Verenchikov, R.G. Gulue “Cylindrical Sectorfield Multi-Turn Time-Of-flight Mass Analyzer With Second Order Focusing” INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 2019, 442, 58-63.
A. N. Verenchikov, M. I.Yavor “Imaging Properties Of A Multi-Reflection Time-Of-flight Massanalyzer” INTERNATIONAL JOURNAL OF MASSSPECTROMETRY 2021, 463, 116547.
A. N. Verenchikov, M.I. Yavor, T.V. Pomozov “Control Of Time Front Tilts In Planar Multi-Reflection Time-Of-flight Massanalyzers By Local Wedge fields” INTERNATIONAL JOURNAL OF MASSSPECTROMETRY 2021, 469, 116680.
D. A. Cooper-Shepherd, J. Wildgoose, B. Kozlov, W. J. Johnson, R. Tyldesley-Worster, M. Palmer, J. B. Hoyes, M. McCullagh, E. Jones, R. Tonge, E. Marsden-Edwards, P. Nixon, A. Verenchikov, J. I. Langridge “A Novel Hybrid Quadrupole Multi-Reflecting Time-Of-Flight Mass Spectrometry System ” J. AM. SOC. MASS SPECTROM. 2023, 34(2), 264–272.
A.N. Verenchikov, N.V. Krasnov, V.A. Shkurov “Electrospray Ionization Developed By Lidija Gall’s Group” INTERNATIONAL JOURNAL OF MASSSPECTROMETRY 2023, 490, 117067.

MSC Conference Presentations

ENHANCED MASS ACCURACY IN MULTI-REFLECTING TOF MS

B. Kozlov(1) R. Denny(1), Yu. Khasin(2), S. Kirillov2, V. Makarov2, A.Verentchikov(2), J. Hoyes(1)

  1. Waters, Wilmslow, UK; 2. MS Consulting, Bar, Montenegro.

Advancements in Multi Reflecting High Resolution TOF Mass Spectrometry with Folded Flight Path

Viatcheslav Artaev(1), Michael Mason(1), Peter A Willis(1), George Tikhonov(1), Yury Khasin(2), Anatoly Verenchikov (2)

1. LECO Corporation, St Joseph, MI; 2. MSC-CG, Bar, Montenegro

Fast Ion Mobility Spectrometry And High Resolution TOF MS

Boris Kozlov1, Vasily Makarov1, Igor Kurnin2, Anatoly Verenchikov1.

1 – Mass Spectrometry Consulting, Bar, Montenegro; 2 – Institute for Analytical Instrumentation, RAS, St. Petersburg, Russia

Development Of A Soft Ionization Discharge Source For Gas Chromatography Used With A High Resolution Time Of Flight Mass Spectrometer.

Lloyd Allen1, Alexander Kolosov2, Viatcheslav Artaev1, Anatoly Verenchikov2

1 – LECO Corporation, St. Joseph, MI; 2 – Mass Spectrometry Consulting, Bar, Montenegro